KBM Corporation

Semiconductor

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  • Place of Origin: Korea

Description

Description

 

 

• Probe Pin

 프로브 핀

- A core part of the probe card used in semiconductor wafer inspection; probes semiconductor chips using electric signals in direct contact with the semiconductor's wafer bump.
 
 

Pogo-Pin

  포고핀

- A pin that electrically connects the terminal of the semiconductor device and the testing equipment's pad; is used in testing camera modules, display modules, image sensors, LCD inspecting devices, etc.
 

Wire Probe

  와이어 프로브

- A probe pin used in COF film inspecting tools.
- High pin pressure
- Stable electric resistance
- Long life span (can be used over 1 million times)
 

Probe Card

  Memory용 프로브카드

- Probe Card is a semiconductor inspection part for Wafer Test Process which is inspecting whether hundreds of IC Chips on the Wafer have defectives or not.
 
 
 
 

DDI  Probe Card

  DDI용 프로브카드

- Used for inspection of IC(DDI) for LCD operation
- Mid, Large size of TFT LCD for Laptop PC, Small size of TFT LCD for mobile phone, STN LCD for color.

 

 

• LED Probe Card

LED용 프로브카드

 -A probe card used to inspect each chip before packageassembling the LED chips.


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  • Semiconductor image

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KBM Corporation
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